作者: S. Hinojosa , Rafael Espinosa-Luna
DOI: 10.1016/J.OPTCOM.2005.02.028
关键词: Plane (geometry) 、 Optical polarization 、 Optics 、 Physics 、 Mueller calculus 、 Similarity (geometry) 、 Incidence (geometry) 、 Eigenvalues and eigenvectors 、 Conical surface 、 Trace (linear algebra)
摘要: Abstract We present results of mathematical relations existing between the Mueller matrix obtained for an in-plane incidence scattering geometry (plane matrix, PMM) and out-the-plane (conical CMM), light scattered from a rough surface. obtain similarity relation CMM PMM one- (1-D) two-dimensional (2-D) surfaces. This implies that have same determinant, trace eigenvalues 1-D 2-D surfaces, respectively. can say measurements made in conical are “Similarity Equivalent” to those both kind