作者: Rafael Espinosa-Luna , Gelacio Atondo-Rubio , Alberto Mendoza-Suárez
DOI: 10.1016/J.OPTCOM.2005.07.021
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摘要: We present results of the complete determination Mueller matrix for light scattered by a one-dimensional random rough metallic surface under conical or out-the-plane incidence geometry. and apply reduced method its determination. This considers only 16 intensity-polarized measurements instead 36 recently reported. Effects related with enhanced backscattering were observed.