Comment to the images of silicon in 〈110〉 orientation
作者： Kazuhiko Izui , Shigemi Furuno
DOI: 10.1016/0304-3991(87)90040-4
关键词: Orientation (computer vision) 、 Atom (measure theory) 、 Chemistry 、 Optics 、 Silicon
摘要: Abstract The comment to some criticism about our images of 〈110〉-oriented silicon is presented confirm that the observed represent correct atom positions with a reasonable accuracy.
elsevier.com
sci-hub.se 参考文章(4)
Observations of Crystal Structure Images of Silicon Journal of Electron Microscopy. ,vol. 26, pp. 129- 132 ,(1977) , 10.1093/OXFORDJOURNALS.JMICRO.A050049
High Resolution Electron Microscopy of Images of Atoms in Silicon Crystal Oriented in (110) Journal of Electron Microscopy. ,vol. 27, pp. 171- 179 ,(1978) , 10.1093/OXFORDJOURNALS.JMICRO.A050114
J. C. H. Spence, Albert V. Crewe, Experimental High-Resolution Electron Microscopy ,(1980)
J.L. Hutchison, Below the “Scherzer resolution” limit: Fact and artefact Ultramicroscopy. ,vol. 9, pp. 191- 196 ,(1982) , 10.1016/0304-3991(82)90199-1