Below the “Scherzer resolution” limit: Fact and artefact

摘要: Abstract Although modern HREMs have stabilities such that spacings considerably smaller than the “point resolution” of instrument - “Scherzer limit”, 0.7 Cs 1 4 λ 3 may readily be recorded, interpretation images in terms atomic structure object is not straightforward. A familiar example images, “dumbbell images” 〈110〉 oriented silicon and related materials, discussed some detail, it shown accurate imaging individual columns, axial mode, requires rather better resolution currently available. Secondly, an HREM study certain defects natural diamonds presented, which a probable for controversial “{100} platelets” derived from critical image-matching experiments, thus demonstrating that, if parameters as defocus specimen thickness can measured (or estimated) accurately, possible to extract meaningful information utilise full instrumental capabilities available, are limited by microscope.