A Flowmeter with Piezoresistive Metal Layer Deposited with Focused-Ion-Beam System

作者: Dae Keun Choi , Sang Hoon Lee

DOI: 10.1080/10584587.2014.912910

关键词: OptoelectronicsMaterials sciencePiezoresistive effectFocused ion beamFlow measurementMicroelectromechanical systemsElectrical resistivity and conductivityLayer (electronics)Analytical chemistrySensitivity (electronics)Gallium

摘要: In this paper, we fabricated and evaluated a flowmeter with sub-micron sized piezoresistive layer for the measurement in small area. For area detection, sensing material should be reduced as well sensor body. We use FIB system to reduce size of obtain line width. The device is standard MEMS process, platinum selected considering electrical conductivity. 0∼4m/s air flows are applied experimental results shows negative sensitivity output -3.22E−5/ms−1. This value due additional materials like carbon gallium. various experiments including stability repeatability performed, repeated operation stable signals less than 9.6% variation. Through those experiment results, assisted suitable detection can a...

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