作者: M Zhang , XL Ma , DX Li , SJ Xie , RPH Chang
DOI: 10.1016/J.MATCHEMPHYS.2008.06.033
关键词: Thin film 、 Microstructure 、 Materials science 、 Chemical vapor deposition 、 Transmission electron microscopy 、 Tetragonal crystal system 、 Perovskite (structure) 、 Molecular beam epitaxy 、 Substrate (electronics) 、 Crystallography
摘要: Perovskite-based BaNb(0.2)Ti(0.8)O(3) (BNTO) thin film, grown by computer-controlled laser molecular beam epitaxy on SrTiO(3) (001) substrate, was investigated means of high-resolution electron microscopic (HREM) imaging, high-angle annular dark-field (HAADF) and X-ray energy dispersive spectrometric (XEDS) line-scanning in a transmission microscope. The microstructure the film is clarified terms various domains due to tetragonal characteristics. Compositional fluctuation observed domain boundaries. misfit strain element diffusivity during growth together with inherent characteristics are discussed as possible mechanism for formation distribution domains. (C) 2008 Elsevier B.V. All rights reserved.