Arc fault risk assessment and degradation model development for photovoltaic connectors
作者： Benjamin B. Yang , Kenneth M. Armijo , Richard K. Harrison , Kara E. Thomas , Jay Johnson
DOI: 10.1109/PVSC.2014.6924875
关键词: Computer science 、 Arc (geometry) 、 Risk assessment 、 Prognostics 、 Reliability engineering 、 Reliability (semiconductor) 、 Cable gland 、 Arc-fault circuit interrupter 、 Photovoltaic system 、 Degradation (telecommunications)
摘要: This work investigates balance of systems (BOS) connector reliability from the perspective arc fault risk. Accelerated tests were performed on connectors for future development a model. Thousands hours damp heat and atmospheric corrosion found BOS to be resilient corrosion-related degradation. A procedure was also developed evaluate new aged The measurements show that risk is dependent combination materials composition as well design geometry. Thermal optical emission spectroscopy further characterize plasma. Together, degradation model, assessment technique, characterization methods can provide operators photovoltaic installations information necessary develop data-driven plan maintenance identify opportunities prognostics.
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