Reliability model development for photovoltaic connector lifetime prediction capabilities
作者： Benjamin B. Yang , N. Robert Sorensen , Patrick D. Burton , Jason M. Taylor , Alice C. Kilgo
DOI: 10.1109/PVSC.2013.6744115
关键词: Automotive engineering 、 Statistical analysis 、 Reliability model 、 Damp heat 、 Environmental science 、 Cable gland 、 Photovoltaic system 、 Reliability (semiconductor) 、 Standard deviation 、 Population
摘要: This paper describes efforts to characterize different aspects of photovoltaic connector reliability. The resistance variation over a population connections was examined by measuring 75 connectors from three manufacturers. comparison shows differences in average up 9% between standard deviation among the same manufacturer ranged 6%-11%. In separate experiment, corrosive effects grime on pins during damp heat accelerated testing at 85°C/85% RH were studied. We observed small increase first 100 hours and no further changes current 450 available data. With exception one connector, performance could not be measured this time period.
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