Contactless millimeter wave method for quality assessment of large area graphene
作者： D Bloos , J Kunc , L Kaeswurm , R L Myers-Ward , K Daniels
关键词: Extremely high frequency 、 Electrical contacts 、 Optoelectronics 、 Charge carrier 、 Absorption (electromagnetic radiation) 、 Microwave 、 Graphene 、 Fabrication 、 Materials science 、 Characterization (materials science)
摘要: We demonstrate that microwave absorption experiments offer a route for easy and efficient measurements of transport properties fast accurate quality control graphene. This conctactless characterization method can be used to quickly evaluate over large areas without recourse complex lithographic methods making it suitable as probe during wafera#13; scale fabrication. In particular, we measurement is sensitive inhomogeneities in sample properties. contrast traditional using electrical contacts which tend overestimate due the formation preferential conducting channels between electrodes. Here compare Shubnikov-dea#13; Haas oscillations simultaneously detected by conventional contact Hall bar Fields up 15T on quasi-free standing, area (~ 25mmalt;supagt;2alt;/supagt;) monolayer find although evaluated charge carrier densities from both are similar, mobility differs considerably electronic inhomogeneity.
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