Electromigration: A review
作者： D.G. Pierce , P.G. Brusius
DOI: 10.1016/S0026-2714(96)00268-5
关键词: Electronic circuit 、 Fundamental physics 、 Integrated circuit 、 Scaling 、 Process control 、 Electronic engineering 、 Engineering 、 Electromigration 、 Reliability (semiconductor) 、 Reliability engineering 、 Empirical data
摘要: … electromigration is a key reliability issue. Because many of the factors that contribute to electromigration … In this article electromigration is reviewed from the prospective of the reliability …
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sci-hub.se 参考文章(106)
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