A development of lifetime measurement based on the differential decay curve method
作者： Jian Zhong , Xiao-Guang Wu , Ying-Jun Ma , Yun Zheng , Cong-Bo Li
DOI: 10.1007/S41365-018-0453-6
关键词: Physics 、 Decay curve 、 Experimental uncertainty analysis 、 Spectral line 、 Development (differential geometry) 、 State (functional analysis) 、 Atomic physics 、 Differential (infinitesimal)
摘要: A new development of indirect gating case in the differential decay curve method used for lifetime measurement has been introduced. The gate region was extended from partial shifted peak to both and unshifted components. statistics flight stop peaks spectra improved obviously. reliability this change tested by reanalysing $$2^{+}$$ state $$^{134} \hbox {Ce}$$ . result 32.2(33) ps fit well with previous published values within experimental uncertainty. developed also analyse $$2_1^{+}$$ $$^{138} {Nd}$$
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