作者: B. Yang , T. K. Song , S. Aggarwal , R. Ramesh
DOI: 10.1063/1.120396
关键词: Doping 、 Analytical chemistry 、 Ferroelectricity 、 Epitaxy 、 Materials science 、 Saturation (magnetic) 、 Coercivity 、 Capacitor 、 Thin film 、 Low voltage
摘要: We report low voltage (1.5–3 V) performance of ferroelectric Pb(Zr,Ti)O3 based capacitors. La substitution up to 10% was performed systematically lower the coercive and saturation voltages epitaxial capacitors grown on Si using a (Ti0.9Al0.1)N/Pt conducting barrier composite. Ferroelectric substituted with show significantly compared 0% 3% La. This is attributed systematic decrease in tetragonality (i.e., c/a ratio) phase. Furthermore, samples doped showed dramatically better retention pulse width dependent polarization These promise as storage elements power high density memory architectures.