作者: J. Marchal , N. Tartoni , C. Nave
DOI: 10.1016/J.NIMA.2009.01.076
关键词: Optics 、 Diamond 、 CMOS 、 Optoelectronics 、 Semiconductor 、 Detector 、 Pixel 、 Diffraction 、 Synchrotron 、 Physics 、 Scattering
摘要: A wide range of position-sensitive X-ray detectors have been commissioned on the synchrotron beamlines operating at Diamond Light Source in UK. In addition to mature technologies such as image-plates, CCD-based detectors, multi-wire and micro-strip gas more recent based semiconductor pixel or strip sensors coupled CMOS read-out chips are also use for routine diffraction scattering experiments. The performance several commercial developmental pixel/strip studies discussed with emphasis image quality achieved these devices. Examples detector applications well status commissioning presented. Finally, priorities ideas future developments discussed.