Electron microscopy of catalyst particles
作者： L.D. Schmidt , T. Wang , A. Vacquez
DOI: 10.1016/0304-3991(82)90286-8
关键词: Energy filtered transmission electron microscopy 、 Cryo-electron microscopy 、 Dark field microscopy 、 Materials science 、 Electron diffraction 、 Electron microscope 、 Scanning confocal electron microscopy 、 Reflection high-energy electron diffraction 、 Chemical engineering 、 Analytical chemistry 、 High-resolution transmission electron microscopy
摘要: Abstract Since heterogeneous catalysts are usually 10–200A particles supported on oxides, high resolution electron microscopy is uniquely suited to catalyst characterization. Some of the uses will be illustrated for Pt graphite, Pt-alloys SiO 2 , and Ni with structures characterized by bright dark field imaging, phases diffraction. Uses weak beam imaging determine shapes also discussed.
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sci-hub.se 参考文章(1)
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