An improved wedge calibration method for lateral force in atomic force microscopy
作者： M. Varenberg , I. Etsion , G. Halperin
DOI: 10.1063/1.1584082
关键词: Data processing 、 Wedge (geometry) 、 Observational error 、 Non-contact atomic force microscopy 、 Materials science 、 Improved method 、 Optics 、 Grating 、 Atomic force microscopy
摘要: An improved wedge calibration method for quantitative lateral force measurement in atomic microscopy is presented. The differs from the original one several aspects. It utilizes a much simpler, commercially available, grating and can be performed at any single specified applied load. enables of all types probes, both integrated with sharp tips, colloidal radius curvature up to 2 μm. also simplifies considerably calculation factor by using flat facets on cancel out system errors. A scheme data processing on-line
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