Microelectronic test probe with defect marker access
作者： Richard C Harmon
DOI:
关键词: Microelectronics 、 Materials science 、 Test probe 、 Nanotechnology 、 Electronic engineering
摘要:
lens.org 参考文章(4)
Turner Roger S, Drauglis Clyde O, Multipoint probe apparatus for electrically testing multiple surface points within small zones ,(1964)
Richard E Rhodes, Multiple probe resistivity measuring apparatus with workpiece support means ,(1960)
Seng Robert, Nail detector utilizing metallic particles ,(1964)