An automated relaxation calorimeter with extended temperature range

作者: B. F. Griffing , S. A. Shivashankar

DOI: 10.1063/1.1136374

关键词: Atmospheric temperature rangeThermal relaxationThermal conductivityAbsolute measurementThermodynamicsMaterials scienceCalorimeterRelaxation (physics)Instrumentation (computer programming)

摘要: A computer‐automated thermal relaxation calorimeter for use in the temperature range 4–380 K is described. The system can be utilized to make absolute measurements on fairly small (20 mg.) samples which may of low conductivity. new hybrid sweep‐decay mode operation measuring heats transition demonstrated.

参考文章(10)
R. E. Schwall, R. E. Howard, G. R. Stewart, Automated small sample calorimeter Review of Scientific Instruments. ,vol. 46, pp. 1054- 1059 ,(1975) , 10.1063/1.1134393
Gul Dad Khattak, P. H. Keesom, S. P. Faile, Specific heats of the vanadium Magneli phases V/sub n/O/sub 2n/-1 between 0. 4 and 50 K Physical Review B. ,vol. 18, pp. 6181- 6190 ,(1978) , 10.1103/PHYSREVB.18.6181
Koshichi Noto, Takeo Murata, Tetsuo Fukase, Masaaki Naka, Kouji Arikawa, Thermometric Properties of Commercial Switching Diodes Japanese Journal of Applied Physics. ,vol. 16, pp. 665- 666 ,(1977) , 10.1143/JJAP.16.665
P. Dierckx, An algorithm for smoothing, differentiation and integration of experimental data using spline functions Journal of Computational and Applied Mathematics. ,vol. 1, pp. 165- 184 ,(1975) , 10.1016/0771-050X(75)90034-0
B. F. Griffing, S. A. Shivashankar, Use of light‐emitting diodes as temperature sensors Review of Scientific Instruments. ,vol. 48, pp. 1225- 1226 ,(1977) , 10.1063/1.1135231
J.A. Gerber, D.J. Sellmyer, Anomalous behaviour of silicon diode thermometers Cryogenics. ,vol. 18, pp. 619- 620 ,(1978) , 10.1016/0011-2275(78)90193-5
Ichiro Hatta, Heat capacity measurements by means of thermal relaxation method in medium temperature range Review of Scientific Instruments. ,vol. 50, pp. 292- 295 ,(1979) , 10.1063/1.1135818
Koshichi Noto, R. P. Huebener, Temperature and Magnetic Field Dependence of Several Commercial Si-Diodes and Their Applicability as Thermometers Japanese Journal of Applied Physics. ,vol. 17, pp. 735- 736 ,(1978) , 10.1143/JJAP.17.735
Stanford University. Microwave Laboratory, Heat Capacity Measurements on Small Samples at Low Temperatures Review of Scientific Instruments. ,vol. 43, pp. 205- 214 ,(1972) , 10.1063/1.1685596