作者： Noureddine Benramdane , Halima Benattou , Kamel Sahraoui
DOI:
关键词: Equivalent circuit 、 Polarization (electrochemistry) 、 Relaxation (NMR) 、 Materials science 、 Electrical impedance 、 Nuclear magnetic resonance 、 Dielectric spectroscopy 、 Dielectric 、 Analytical chemistry 、 Thermal conduction 、 Thin film
摘要: The DC and AC electrical conduction of (ZnO)(X)(CdO)(1-X) thin films were investigated in this work. conductivity (X=0.2, 0.7) was reported the frequency range 5 Hz to 13 MHz at temperature 20 °C, 40 °C 60 using impedance spectroscopy. main results presented by dependence complex real imaginary parts samples Nycquist diagrams different temperatures. Thin properties determined, proposing an equivalent circuits constituted resistances capacities. relaxation times values (ZnO)(0.7)(CdO)(0.3) computed suggested two process. on revealed that a correlated barrier hopping model most probable process films. Furthermore calculated dielectric constants depended temperature. interfacial orientation polarization contributed enhancement response composites. Copyright © 2014 IFSA Publishing, S. L.