Correlation between luminescence and structural properties of Si nanocrystals

作者: Fabio Iacona , Giorgia Franzò , Corrado Spinella

DOI: 10.1063/1.372013

关键词: Order of magnitudeSilicon oxideLuminescenceSiliconMaterials sciencePlasma-enhanced chemical vapor depositionPhotoluminescenceAnnealing (metallurgy)Analytical chemistryThin film

摘要: … PL intensity increases with increasing the Si content; at 1200C the light emission from sample S4 42 at.% Si becomes the highest due to the saturation of the PL … Si content, S2 37 at. % …

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