Ultra-thin resin embedding method for scanning electron microscopy of individual cells on high and low aspect ratio 3D nanostructures.

作者: A. BELU , J. SCHNITKER , S. BERTAZZO , E. NEUMANN , D. MAYER

DOI: 10.1111/JMI.12378

关键词: Scanning electron microscopeTissue EmbeddingTransmission electron microscopyElectron beam-induced depositionEpoxyComposite materialScanning confocal electron microscopyScanning ion-conductance microscopyNanotechnologyMaterials scienceFocused ion beam

摘要: The preparation of biological cells for either scanning or transmission electron microscopy requires a complex process fixation, dehydration and drying. Critical point drying is commonly used samples investigated with beam, whereas resin-infiltration typically microscopy. may cause cracks at the cellular surface sponge-like morphology nondistinguishable intracellular compartments. Resin-infiltrated result in solid block resin, which can be further processed by mechanical sectioning, however that does not allow top view examination small cell-cell cell-surface contacts. Here, we propose method removing resin excess on before effective polymerization. In this way to embedded an ultra-thin layer epoxy resin. This novel highlights contrast standard methods imaging individual only nanostructured planar surfaces but also topologically challenging substrates high aspect ratio three-dimensional features

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