Precise and economic FIB/SEM for CLEM: with 2 nm voxels through mitosis
作者： Manja Luckner , Gerhard Wanner
DOI: 10.1007/S00418-018-1681-X
关键词:
摘要: A portfolio is presented documenting economic, high-resolution correlative focused ion beam scanning electron microscopy (FIB/SEM) in routine, comprising: (i) the use of custom-labeled slides and coverslips, (ii) embedding cells thin, or ultra-thin resin layers for light (CLEM) (iii) claim to reach highest resolution possible with FIB/SEM xyz. Regions interest (ROIs) defined microscope (LM), can be relocated quickly precisely SEM. As proof principle, HeLa were investigated 3D context at all stages cell cycle, ultrastructural changes during mitosis: nuclear envelope breakdown reassembly, Golgi degradation reconstitution formation midzone midbody.
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