Test circuit for semiconductor memory and semiconductor memory device
作者： Yutaka Shimada , Yoshinori Fujiwara
DOI:
关键词: Circuit extraction 、 Equivalent circuit 、 Electronic engineering 、 Discrete circuit 、 Semiconductor memory 、 Asynchronous circuit 、 Analog signal 、 Signal chain 、 Synchronous circuit 、 Computer science
摘要: According to the present invention, a pseudo-error signal generating circuit is provided between memory and self-test circuit. The converts an output of based on setting supply necessary verify operation has scan chain in which set, generates signal.
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