Ferroelectric memory devices employing conductivity modulation of a thin semiconductor material or a two-dimensional charge carrier gas and methods of operating the same

作者: Bedau Daniel , Stewart Derek , Kalitsov Alan , Bertero Gerardo

DOI:

关键词: Materials scienceBand gapOptoelectronicsElectrical conductorSemiconductor materialsMonolayerCharge carrierElectrodeLayer (electronics)Ferroelectricity

摘要: A ferroelectric memory device contains a two-dimensional semiconductor material layer having band gap of at least 1.1 eV and one thickness 1 to 5 monolayers atoms the or includes charge carrier gas layer, source contact contacting first portion drain second element located between contacts adjacent surface conductive gate electrode element.