Characterization of Materials by Micro-Raman Spectroscopy
作者： P.V. Huong , A.L. Verma , J.-P. Chaminade , L. Nganga , J.-C. Frison
DOI: 10.1016/0921-5107(90)90064-I
关键词: Optical microscope 、 Optics 、 Semiconductor 、 Spectroscopy 、 Laser 、 Transmission Raman spectroscopy 、 Raman spectroscopy 、 Monochromator 、 Materials science 、 Coherent anti-Stokes Raman spectroscopy
摘要: Abstract When illuminating a sample with laser through an optical microscope, before collecting the scattered light in monochromator of Raman spectrometer, micro-Raman spectra can be recorded from surface area as small 1 μm 2 . Thus individual components heterogeneous micrometre size selectively investigated. Vibrations and phonons observed are directly connected structure dynamics solids. many useful correlations deduced. polarization is also helpful determination orientations solids layers. Step-etched bevelled samples layers on substrates studied by spectroscopy reveal local structural changes new chemical bonds at interfaces well regularity epitaxial function their thickness. These other advantages due to recent advances technology will illustrated examples semiconductor superconductor materials.
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