Coherent X-ray Diffraction Imaging of Nanostructures

摘要: We present here an overview of Coherent X-ray Diffraction Imaging (CXDI) with its application to nanostructures. This imaging approach has become especially important recently due advent Free-Electron Lasers (XFEL) and applications the fast developing technique serial crystallography. start basic description coherent scattering on finite size crystals. The difference between conventional crystallography applied large samples is outlined. formalism from a crystal strain field considered. Partially illumination crystalline sample developed. Recent experimental examples demonstrating CXDI study structures nanoscale, including experiments at FELs, are also presented.