Analysis of Coherence Properties of 3-rd Generation Synchrotron Sources and Free-Electron Lasers

作者: I A Vartanyants , A Singer

DOI: 10.1088/1367-2630/12/3/035004

关键词: UndulatorTransverse planeLaserCoherence (physics)SynchrotronFree electron modelGaussianStorage ringPhysicsOptics

摘要: A general theoretical approach based on the results of statistical optics is used for analysis transverse coherence properties 3-rd generation synchrotron sources and x-ray free-electron lasers (XFEL). Correlation wavefields are calculated at different distances from an equivalent Gaussian Schell-model source. This model to describe five meter undulator source storage ring PETRA III. In case XFEL decomposition fields into a sum independently propagating modes these new sources. detailed calculation performed parameters SASE1 European XFEL. It demonstrated that only few contribute significantly total radiation field

参考文章(40)
M. R. Howells, B. M. Kincaid, The properties of undulator radiation Lawrence Berkeley National Laboratory. pp. 315- 358 ,(1994) , 10.1007/978-94-011-0868-3_13
Leonard Mandel, Emil Wolf, Optical Coherence and Quantum Optics ,(1995)
L. Landau, E. Lifshitz, William Rarita, The Classical Theory of Fields Physics Today. ,vol. 5, pp. 25- 25 ,(1952) , 10.1063/1.3067575
Joseph W. Goodman, Statistical Optics ,(1985)
Gerhard Grübel, Federico Zontone, Correlation spectroscopy with coherent X-rays Journal of Alloys and Compounds. ,vol. 362, pp. 3- 11 ,(2004) , 10.1016/S0925-8388(03)00555-3
Frédéric Livet, Diffraction with a coherent X-ray beam: dynamics and imaging Acta Crystallographica Section A. ,vol. 63, pp. 87- 107 ,(2007) , 10.1107/S010876730605570X
Jianwei Miao, Pambos Charalambous, Janos Kirz, David Sayre, Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimens Nature. ,vol. 400, pp. 342- 344 ,(1999) , 10.1038/22498
Mark A. Pfeifer, Garth J. Williams, Ivan A. Vartanyants, Ross Harder, Ian K. Robinson, Three-dimensional mapping of a deformation field inside a nanocrystal Nature. ,vol. 442, pp. 63- 66 ,(2006) , 10.1038/NATURE04867
Henry N. Chapman, Anton Barty, Stefano Marchesini, Aleksandr Noy, Stefan P. Hau-Riege, Congwu Cui, Malcolm R. Howells, Rachel Rosen, Haifeng He, John C. H. Spence, Uwe Weierstall, Tobias Beetz, Chris Jacobsen, David Shapiro, High-resolution ab initio three-dimensional x-ray diffraction microscopy Journal of The Optical Society of America A-optics Image Science and Vision. ,vol. 23, pp. 1179- 1200 ,(2006) , 10.1364/JOSAA.23.001179