Jumping mode scanning force microscopy
作者： P. J. de Pablo , J. Colchero , J. Gómez-Herrero , A. M. Baró
DOI: 10.1063/1.122751
关键词: Scanning ion-conductance microscopy 、 Atomic force acoustic microscopy 、 Conductive atomic force microscopy 、 Magnetic force microscope 、 Non-contact atomic force microscopy 、 Scanning probe microscopy 、 Optics 、 Electrostatic force microscope 、 Chemistry 、 Scanning capacitance microscopy
摘要: In this letter, we present a new scanning probe microscopy mode, jumping which allows the simultaneous measurement of topography and some other physical property sample. Essentially, at each image point first sample is measured during feedback phase cycle, then tip–sample interaction evaluated in real time as tip moved away towards Since lateral motion done out contact method free, or nearly shear forces. The general advantages mode are discussed. Finally, two different applications presented. addition to topography, application measures adhesion between sample, while second determines corresponding electrostatic interaction.
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