Contactor and probe assembly for electrical test apparatus

摘要: Substrates are tested by conductive, individually plug replaceable, buckling beam probes in a probe pattern to engage the circuitry on substrate. When substrate, they buckle as given engaging force is exceeded. Each socket adapted releasably retain inserted its socket. The and sockets axially mounted housing. A has first end oriented second engaged sleeve displayed radially. Guides have guide pins cooperate with companion ways contours such slots. substrate member, an actuator move member relative along of ways. Cams affixed housing approximately 180 degrees from one another, cam follower movably cams so engages cams, driven cams. either shrouds ends probes, or exposes circuitry.