Micrometer thickness gage

作者: Louis Michelson

DOI:

关键词: Materials scienceMicrometerOpticsNull (radio)Capacitance bridgeVertical directionElectrodeCalibrationSheet material

摘要: A gage for measuring the deviation in thickness of sheet material by sum capacitances between a top electrode and upper surface lower bottom sheet. The is calibrated with precise calibration known thickness, adjusting vertical position to produce null output on capacitance bridge. For measuring, electrode, adjustably mounted micrometer screw, then adjusted distance precisely equal difference target be measured.