作者: S. Piano , X. Marti , A. W. Rushforth , K. W. Edmonds , R. P. Campion
DOI: 10.1063/1.3579534
关键词: Bar (unit) 、 Magnetic anisotropy 、 Anisotropy 、 Symmetry breaking 、 Morphology (linguistics) 、 Surface (mathematics) 、 Condensed matter physics 、 Amplitude 、 Diffraction 、 Materials science
摘要: Atomic Force Microscopy and Grazing incidence X-ray diffraction measurements have revealed the presence of ripples aligned along $[1\bar{1}0]$ direction on surface (Ga,Mn)As layers grown GaAs(001) substrates buffer layers, with periodicity about 50 nm in all samples that been studied. These show strong symmetry breaking uniaxial magnetic anisotropy normally observed such materials. We observe a clear correlation between amplitude strength component suggesting these might be source anisotropy.