作者: Yusuke Oike
DOI:
关键词: Electronic engineering 、 Voltage 、 Image sensor 、 Electronic circuit 、 Solid-state 、 Pixel 、 Image (mathematics) 、 Pickup 、 Engineering 、 Voltage reference
摘要: High-resolution AD conversion can be performed at a high speed in CMOS image sensor which column-parallel ADCs are mounted. In 10 mounted, reference voltages Vref 1 to 4 having slopes with different gradients and voltage 5 used. Additionally, comparison circuit 32 that compares an output Vx of unit pixel 11 any one the , 33 included column processing 15 . is by respective operations circuits up/down counter 34.