FORMATION OF THIN FILM DEVICE

作者: Amemori Kazuhiko , Tsutsumi Shoichi , Takahashi Yoshio

DOI:

关键词: Plasma etchingEtching (microfabrication)Composite materialDry etchingSubstrate (printing)ResistThin filmMaterials scienceSputteringArgon

摘要: PURPOSE:To increase insulation resistance in each thin film device by performing ion mealing or sputter etching, and then, dry etching plasma using a specified gas according to conductive material that is used for the formation of an insulating substrate film. CONSTITUTION:After 2 formed on 3 process technique, masking done part as required resist 1, unnecessary removed 3, ethcing performed gas. A residual metal, metallic particle abrashed argon re-adheres during reduced compound so be exhaust. Unnecessary metal can thus completely from increased.

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