Measurements of relative x-ray line intensities and their application to a single standard procedure for quantitative x-ray microanalysis

摘要: X-ray spectra collected by an energy dispersive spectrometer on electron microprobe analyzer were deconvoluted to determine relative line intensities between elements for a wide range of atomic numbers. The within spectral series K, L, and M lines also obtained. In the case Kα empirical formula is proposed prediction generated pure element standards that CuKα at 20keV used as reference standard, although other references can be lower beam energies. ratios predicted with accuracy generally better than 2% actual measured values. relationship covers numbers in 12 (Mg) 32 (Ge) incident energies 5 20keV. Unfortunately, L data could not fitted same level single expression due inherent scatter function number. These are therefo...