The efficiency of X‐ray production at low energies

摘要: The absolute efficiency of X-ray production has been determined for the K-lines Al, Si and Cu; L-lines Fe, Co, Cu, Ge As; M-lines Hf, Ir, Pt, Au Bi, using overvoltage ratios in range 1–10. These emissions, with exception Cu K, have critical excitation energies below 2.6 keV are therefore typical lines used microanalysis at low beam energies. For it is found that experimental results good agreement a Bethe, or Casnati, cross-section model. L- Monte Carlo technique to find an effective generation each elements. functional forms these cross-sections be general proposed theoretical models.