A flexible polyimide-based package for silicon sensors

作者: David J. Beebe , Denice D. Denton

DOI: 10.1016/0924-4247(93)00775-Y

关键词: Reliability (semiconductor)Forensic engineeringEpoxyPolyimideTest setupOptoelectronicsMaterials scienceFabricationHydrofluoric acidSiliconLead (electronics)

摘要: Abstract This paper describes the development of a flexible polyimide-based package for silicon sensors. The fabrication process is compatible with standard integrated-circuit processes and produces that sandwiches metal leads between polyimide layers. Polyimide (DuPont PI-2611) found to be resistant isotropic etchant (hydrofluoric acid/nitric acid) used realize sensing islands. Factors affecting reliability, which include lead layout, island size support material at silicon/polyimide interface, are identified investigated. Packages tested in an automated test setup on human subjects. A factor three increase width two-fold reliability. use epoxy as rigid 50-fold reliability

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