作者: David J. Beebe , Denice D. Denton
DOI: 10.1016/0924-4247(93)00775-Y
关键词: Reliability (semiconductor) 、 Forensic engineering 、 Epoxy 、 Polyimide 、 Test setup 、 Optoelectronics 、 Materials science 、 Fabrication 、 Hydrofluoric acid 、 Silicon 、 Lead (electronics)
摘要: Abstract This paper describes the development of a flexible polyimide-based package for silicon sensors. The fabrication process is compatible with standard integrated-circuit processes and produces that sandwiches metal leads between polyimide layers. Polyimide (DuPont PI-2611) found to be resistant isotropic etchant (hydrofluoric acid/nitric acid) used realize sensing islands. Factors affecting reliability, which include lead layout, island size support material at silicon/polyimide interface, are identified investigated. Packages tested in an automated test setup on human subjects. A factor three increase width two-fold reliability. use epoxy as rigid 50-fold reliability