作者: Czang-Ho Lee , Andrei Sazonov , Arokia Nathan
DOI: 10.1063/1.1942641
关键词: Silicon 、 Subthreshold slope 、 Silane 、 Threshold voltage 、 Nanocrystalline silicon 、 Thin-film transistor 、 Nanotechnology 、 Analytical chemistry 、 Plasma-enhanced chemical vapor deposition 、 Materials science 、 Chemical vapor deposition 、 Physics and Astronomy (miscellaneous)
摘要: Hydrogenated nanocrystalline silicon (nc-Si:H) films were deposited by using 13.56MHz plasma-enhanced chemical vapor deposition at 260°C means of a silane (SiH4) plasma heavily diluted with hydrogen (H2). The high-quality nc-Si:H film showed an oxygen concentration (CO) ∼1.5×1017at.∕cm3 and dark conductivity (σd) ∼10−6S∕cm, while the Raman crystalline volume fraction (Xc) was over 80%. Top-gate thin-film transistors employing optimized ∼100nm channel layer exhibited field-effect mobility (μFE) ∼150cm2∕Vs, threshold voltage (VT) ∼2V, subthreshold slope (S) ∼0.25V∕dec, ON∕OFF current ratio ∼106.