作者: Vali Dalouji , Smohammad Elahi , Afshin Ahmadmarvili
DOI: 10.1007/S12633-016-9409-9
关键词: Refractive index 、 Plasma oscillation 、 Materials science 、 Field electron emission 、 Analytical chemistry 、 Charge carrier 、 Wavelength 、 Particle size 、 Dielectric 、 Electric susceptibility
摘要: In this work, the optical properties of carbon–nickel films deposited at different deposition times from 50 to 600 sec were investigated. The obtained data refractive index n can be analyzed obtain high–frequency dielectric constant which describes free carriers and lattice vibration modes dispersion. e L plasma frequency ω p 180 have maximum values 10.68 79.92x106 Hz, respectively. carrier electric susceptibility measurements in wavelength range (300 – 1000 nm) are discussed according Spitzer–Fan model. It is shown that has a value with increasing it increases. energy loss by charge when traversing bulk decreases. field emission scanning electronic microscopy (FESEM) images used for estimation particle size.