Surface Analysis III. Probing Surfaces with Ions
作者： K. Oura , M. Katayama , A. V. Zotov , V. G. Lifshits , A. A. Saranin
DOI: 10.1007/978-3-662-05179-5_6
关键词: Ion 、 Total internal reflection 、 Molecular physics 、 Materials science 、 Ion beam 、 Surface (mathematics)
摘要: There is a set of various analytical techniques which employ an ion beam to probe surface. The most widely used are as follows.
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