作者: Marvin Cummings , Sebastian Gliga , Boris Lukanov , Eric I. Altman , Matthias Bode
DOI: 10.1016/J.SUSC.2010.10.002
关键词: Thin film 、 Molecule 、 Metal 、 Surface reconstruction 、 Nucleation 、 Crystallography 、 Auger electron spectroscopy 、 Epitaxy 、 Materials science 、 Scanning tunneling microscope
摘要: Abstract Here, the interactions of C 60 at surface pseudomorphic Ni/Cu(100) and Co/Ru(0001) thin films its effect on film growth morphology were determined using in-situ scanning tunneling microscopy (STM) Auger electron spectroscopy (AES). The novel development -metallic based nanosystems, such as molecular junction transistors, hinges our ability to understand factors governing structural stability in these nanosystems nature bond –metal interface. In this study, deposited onto Ni(100) is observed be fairly immobile uniformly distributed across Ni surface. On Co(0001) however, mobility severely limited some regions highly mobile others dependent upon Co reconstruction, resulting a non-uniform distribution Despite presence surface, there no obvious influence further growth. contrast, during growth, islands only nucleate grow from step edges or locally around molecules. strength Co–C interaction appears stronger than Co–Co terrace. Generally, both continue epitaxial . AES results indicate molecules maintain their chemical integrity