Scanning tunneling microscopy and x-ray photoelectron diffraction investigation of C 60 films on Cu(100)
作者： M. Abel , A. Dmitriev , R. Fasel , N. Lin , J. V. Barth
DOI: 10.1103/PHYSREVB.67.245407
关键词:
摘要: Ultrathin C 6 0 films grown on a Cu(100) surface in ultrahigh vacuum have been investigated by scanning tunneling microscopy (STM) and x-ray photoelectron diffraction (XPD). STM observations show that following depositionat room temperature molecules decorate substrate steps order densely packed extended islands layers. Two kinds of contrast, i.e., different apparent heights, are encountered the film evolution, which associated with reconstruction inequivalent bonding. At elevated temperatures (500-600 K) striped regular ( 1 04) superstructure is obtained comprising two distinct species. From an XPD analysis this phase corresponding possible bonding configurations could be determined.
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