The nitridation of thick germanium oxide films on single-crystal germanium

作者: E. E. Crisman , O. J. Gregory , P. J. Stiles

DOI: 10.1149/1.2115986

关键词: GermaniumNitrogenGermanium oxideChemistrySingle crystalGermanium nitrideInorganic chemistryAnalytical chemistryNitridingRefractive indexThin film

摘要: The far-infrared (FIR) transmission properties and index of refraction thick ( about 2000 A) vitreous germanium oxide films on single-crystal have been measured before after high temperature reaction with flowing ammonia gas. Significant shifts in the spectra were observed as a function both time NH/sub 3/ flow rate. Correlation was minima reported literature for fine powders nitride thin (<1000A) layers ion-implanted annealed germanium/oxygen germanium/ nitrogen complexes. In addition, when nitrided reoxidized at pressure, structure which corresponded to FIR hexagonal-phase GeO/sub 2/ powder specimens.

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