An Accurate and Robust Strip-Edge-Based Structured Light Means for Shiny Surface Micromeasurement in 3-D

摘要: Three-dimensional measurement of shiny or reflective surface is a challenging issue for optical-based instrumentations. In this paper, we present novel structured light approach direct target so as to skip the coating preprocedure. comparison with traditional image-intensity-based coding strategies like sinusoidal and line patterns, strip edges not raw image intensities are encoded in illuminated patterns. With generally better preserved than individual intensity data presence reflections, such strategy more robust. To remove periodic ambiguity within Gray code patterns adopted. localize precisely, both positive negative used. An improved zero-crossing feature detector that has subpixel accuracy proposed strip-edge localization. The experimental setup configured merely an off-the-shelf pico-projector camera. Extensive experiments including evaluation, previous algorithms, reconstruction some real objects shown demonstrate system's endurance against nature surfaces.