Advanced x-ray stress analysis method for a single crystal using different diffraction plane families
作者： Muneyuki Imafuku , Hiroshi Suzuki , Kazuyuki Sueyoshi , Koichi Akita , Shin-ichi Ohya
DOI: 10.1063/1.2912030
关键词: Plane stress 、 Single crystal 、 Orientation (geometry) 、 Molecular physics 、 Lattice constant 、 Stress (mechanics) 、 Optics 、 Plane (geometry) 、 X-ray crystallography 、 Physics 、 Diffraction
摘要: Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate plane states any combination diffraction planes. We can choose and combine appropriate sources families, depending on sample orientation apparatus, whenever condition is satisfied. The distributions in an iron demonstrated combining data Fe{211} Fe{310} families.
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