GROWTH OF AMORPHOUS-LAYER-FREE MICROCRYSTALLINE SILICON ON INSULATING GLASS SUBSTRATES BY PLASMA-ENHANCED CHEMICAL VAPOR DEPOSITION

作者: Jiang-Huai Zhou , Kazuyuki Ikuta , Tetsuji Yasuda , Takahide Umeda , Satoshi Yamasaki

DOI: 10.1063/1.119958

关键词: Layer (electronics)Amorphous solidMaterials scienceChemical vapor depositionAnalytical chemistrySiliconDilutionPlasma-enhanced chemical vapor depositionHydrogenCombustion chemical vapor deposition

摘要: Using a triode plasma-enhanced chemical vapor deposition (PECVD) system and high H2 dilution of SiH4 (down to SiH4/H2 gas flow ratio 0.33/99), amorphous-layer-free μc-Si:H has been successfully grown on insulating glass substrates in the continuous PECVD growth mode. It is demonstrated that an ultrathin layer such can serve as seed facilitate epitaxial-like (seeded growth).

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