作者: Hiroshi Mitsuhashi , Iwao Mitsuishi , Hiroshi Kukimoto
DOI: 10.1143/JJAP.24.L864
关键词: Chemical vapor deposition 、 Analytical chemistry 、 Crystal growth 、 Metalorganic vapour phase epitaxy 、 X-ray crystallography 、 Optics 、 Chemistry 、 Thin film 、 Zinc 、 Microstructure 、 Epitaxy 、 General Engineering 、 General Physics and Astronomy
摘要: ZnSxSe1-x epitaxial layers have been grown on GaAs (100) substrates by metalorganic chemical vapor deposition (MOCVD) using Zn-, S- and Se-alkyls. With this source combination, the premature reaction typically encountered in conventional MOCVD of zinc chalcogenides Zn-alkyls H2S or H2Se can be eliminated. The composition is easily controlled transport rates High crystalline quality lattice matched samples evident from surface morphology line width double crystal X-ray diffraction.