作者: Leonard Forbes , Paul A. Farrar , Kie Y. Ahn
DOI:
关键词: Atomic layer deposition 、 Optoelectronics 、 Materials science 、 Gate oxide 、 Gate dielectric 、 Electrical engineering 、 Germanium 、 Substrate (electronics) 、 Carbon 、 Transistor 、 Silicon
摘要: One aspect of this disclosure relates to a method for forming transistor. According various embodiments, gate dielectric is formed on substrate, substitutable structure the dielectric, and source/drain regions transistor are formed. A desired material substituted provide dielectric. Some embodiments use carbon material, some silicon, germanium or silicon-germanium material. form high-k such as may be by an atomic layer deposition process, evaporated metal oxidation process. Other aspects provided herein.