Investigation of the magnetic structures in giant magnetoresistive multilayer films by electron microscopy

作者: L. J. Heyderman , J. N. Chapman , S. S. P. Parkin

DOI: 10.1063/1.358210

关键词: AntiferromagnetismElectron microscopeMagnetic structureGiant magnetoresistanceCrystallographyCondensed matter physicsMaterials scienceTransmission electron microscopyMagnetoresistanceMagnetic domainElectron diffraction

摘要: The magnetic structures which occur in (Co/Ni81Fe19/Co)/Cu multilayer films showing giant magnetoresistance have been investigated using electron microscopy. Rather similar fine domains, with sub‐μm dimensions, were found comprising 14 and 6 layers. Whilst the observed structure depended greatly on history of sample, a combination differential phase contrast imaging low angle diffraction allowed an estimate to be made extent neighboring layers aligned antiparallel each other. For both samples typically two parallel alignment leading possibility that departures from expected antiferromagnetic behavior are more prevalent at surfaces rather than bulk multilayer.

参考文章(3)
J. Zweck, J.N. Chapman, S. McVitie, H. Hoffmann, Reconstruction of induction distributions in thin films from DPC images Journal of Magnetism and Magnetic Materials. ,vol. 104, pp. 315- 316 ,(1992) , 10.1016/0304-8853(92)90813-4
L J Heyderman, J N Chapman, S S P Parkin, Electron microscope observations of the magnetic structures in magnetoresistive multilayer films Journal of Physics D. ,vol. 27, pp. 881- 891 ,(1994) , 10.1088/0022-3727/27/5/001