作者: L. J. Heyderman , J. N. Chapman , S. S. P. Parkin
DOI: 10.1063/1.358210
关键词: Antiferromagnetism 、 Electron microscope 、 Magnetic structure 、 Giant magnetoresistance 、 Crystallography 、 Condensed matter physics 、 Materials science 、 Transmission electron microscopy 、 Magnetoresistance 、 Magnetic domain 、 Electron diffraction
摘要: The magnetic structures which occur in (Co/Ni81Fe19/Co)/Cu multilayer films showing giant magnetoresistance have been investigated using electron microscopy. Rather similar fine domains, with sub‐μm dimensions, were found comprising 14 and 6 layers. Whilst the observed structure depended greatly on history of sample, a combination differential phase contrast imaging low angle diffraction allowed an estimate to be made extent neighboring layers aligned antiparallel each other. For both samples typically two parallel alignment leading possibility that departures from expected antiferromagnetic behavior are more prevalent at surfaces rather than bulk multilayer.