作者: P. R. Aitchison , J. N. Chapman , D. B. Jardine , J. E. Evetts
DOI: 10.1063/1.365505
关键词: Magnetoresistance 、 Sputter deposition 、 Condensed matter physics 、 Materials science 、 Coupling (electronics) 、 Magnetization 、 Giant magnetoresistance 、 Magnetic structure 、 Magnetic domain 、 Grain size
摘要: The understanding of the magnetization processes in Co/Cu multilayers showing substantial giant magnetoresistance (GMR) is incomplete. To gain further insight into coupling and resultant switching characteristics, a series with 3–15 bilayers has been grown by dc magnetron sputtering. Microstructural micromagnetic studies along MR measurements were made on samples. Lorentz microscopy was used to directly observe evolution domain structures under influence an applied field. It appeared that dissimilar occurred different layers. Magnetic generally submicron size although samples few well defined walls also observed during reversal process. Their occurrence coincided abrupt steps GMR curves.