Structure of Liquid/liquid Interfaces Studied by Ellipsometry and Brewster Angle Microscopy
作者： Gerhard H. Findenegg , Jens Schulz , Steffen Uredat
DOI: 10.1016/S0167-2991(01)82027-9
关键词: Liquid liquid 、 Microscopy 、 Brewster's angle 、 Materials science 、 Ellipsometry 、 Analytical chemistry
摘要:
sci-hub.se 参考文章(23)
H. Ted Davis, Statistical Mechanics of Phases, Interfaces and Thin Films ,(1996)
ML Schlossman, PS Pershan, D Langevin, Light Scattering by Liquid Surfaces and Complementary Techniques ,(1991)
Clive A. Croxton, Fluid interfacial phenomena Wiley. ,(1986)
Bernard P. Binks, Modern characterization methods of surfactant systems M. Dekker. ,(1999)
John Shipley Rowlinson, Molecular theory of capillarity ,(1982)
Zhongjian Zhang, Dragoslav M. Mitrinovic, Scott M. Williams, Zhengqing Huang, Mark L. Schlossman, X-ray scattering from monolayers of F(CF2)10(CH2)2OH at the water–(hexane solution) and water–vapor interfaces Journal of Chemical Physics. ,vol. 110, pp. 7421- 7432 ,(1999) , 10.1063/1.478644
Takayuki Ikenaga, Norihiro Matubayasi, Makoto Aratono, Kinsi Motomura, Ryohei Matuura, Solvent Effect on the Adsorption of 1-Octadecanol at Oil/Water Interface Bulletin of the Chemical Society of Japan. ,vol. 53, pp. 653- 657 ,(1980) , 10.1246/BCSJ.53.653
D. Vollhardt, Morphology and phase behavior of monolayers Advances in Colloid and Interface Science. ,vol. 64, pp. 143- 171 ,(1996) , 10.1016/0001-8686(95)00285-5
V. Melzer, D. Vollhardt, Formation of condensed phase patterns in adsorption layers. Physical Review Letters. ,vol. 76, pp. 3770- 3773 ,(1996) , 10.1103/PHYSREVLETT.76.3770
A. Braslau, M. Deutsch, P. S. Pershan, A. H. Weiss, J. Als-Nielsen, J. Bohr, Surface roughness of water measured by X-ray reflectivity Physical Review Letters. ,vol. 54, pp. 114- 117 ,(1985) , 10.1103/PHYSREVLETT.54.114