Millimeter-wave low-noise high electron mobility transistors

作者: P.C. Chao , S.C. Palmateer , P.M. Smith , U.K. Mishra , K.H.G. Duh

DOI: 10.1109/EDL.1985.26219

关键词: TransconductanceField-effect transistorOptoelectronicsCutoff frequencyExtremely high frequencyHigh-electron-mobility transistorPhysicsNoise figureNoise (electronics)Electrical engineeringTransistor

摘要: High electron mobility transistors (HEMT's) have been fabricated which demonstrate excellent millimeter-wave performance. A maximum extrinsic transconductance as high 430 mS/mm, corresponding to an intrinsic of 580 was observed in these transistors. unity current gain cutoff frequency f T 80 GHz and a oscillation f_{\max} 120 were projected for HEMT's. At 40 GHz, minimum noise figure 2.1 dB with associated 7.0 has also measured. These are the highest f_{T}, , best performance reported date. The results clearly potential HEMT's low-noise applications.

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